Search results for: Chun Yu
Journal of Materials Processing Technology > 2017 > 247 > C > 64-72
IEEE Electron Device Letters > 2017 > 38 > 6 > 712 - 715
IEEE Electron Device Letters > 2016 > 37 > 2 > 176 - 178
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Transactions on Microwave Theory and Techniques > 2014 > 62 > 11 > 2723 - 2732
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3625 - 3631
IEEE Transactions on Microwave Theory and Techniques > 2013 > 61 > 2 > 914 - 921
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 1 > 110 - 118
2012 IEEE International Reliability Physics Symposium (IRPS) > EL.3.1 - EL.3.5
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1636 - 1641