Search results for: Chun Yu
2011 International Reliability Physics Symposium > EL.2.1 - EL.2.2
IEEE Journal of Solid-State Circuits > 2010 > 45 > 11 > 2227 - 2238
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1636 - 1641
2009 IEEE Asian Solid-State Circuits Conference > 321 - 324