Search results for: Piotr Martyniuk
Metrology and Measurement Systems > 2023 > Vol. 30, nr 1 > 183--194
Opto-Electronics Review > 2023 > Vol. 31, No. 2 > art. no. e145093
Opto-Electronics Review > 2023 > Vol. 31, Special Issue > art. no. e144551
Opto-Electronics Review > 2023 > Vol. 31, Special Issue > art. no. e144557
Opto-Electronics Review > 2024 > Vol. 32, No. 1 > art. no. e149182
Opto-Electronics Review > 2022 > Vol. 30, No. 2 > art. no. e141596
Opto-Electronics Review > 2021 > Vol. 29, No. 1 > 1--4
physica status solidi (RRL) – Rapid Research Letters > 14 > 4 > n/a - n/a
physica status solidi (a) > 217 > 6 > n/a - n/a
Opto-Electronics Review > 2020 > Vol. 28, No. 2 > 82--92
Opto-Electronics Review > 2020 > Vol. 28, No. 3 > 107--154
Opto-Electronics Review > 2019 > Vol. 27, No. 3 > 275--281
Optical and Quantum Electronics > 2019 > 51 > 2 > 1-6
Metrology and Measurement Systems > 2019 > Vol. 26, nr 1 > 109--114
Infrared Physics and Technology > 2017 > 81 > Complete > 276-281
IEEE Sensors Journal > 2017 > 17 > 3 > 674 - 678
Solid-State Electronics > 2016 > 119 > C > 1-4
IEEE Electron Device Letters > 2016 > 37 > 1 > 64 - 66
IET Optoelectronics > 2014 > 8 > 6 > 239 - 244