Search results for: H. Cheng
2011 International Reliability Physics Symposium > 6B.3.1 - 6B.3.5
2010 International Electron Devices Meeting > 5.4.1 - 5.4.4
IEEE Transactions on Circuits and Systems I: Regular Papers > 2009 > 56 > 8 > 1794 - 1806
2008 IEEE Sensors > 1584 - 1587
2008 IEEE Custom Integrated Circuits Conference > 635 - 638