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With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi-threading (RMT) is an attractive approach for concurrent error detection. RMT provides complete error coverage, while incurring a significant performance impact because of the redundant thread. Achieving perfect reliability...
This paper reports the reliability of fine pitch interconnections using nano-structured nickel as the primary interconnection material. Assembly was accomplished with different bonding methods to provide organic compatible low-temperature fabrication. Au-Sn and Sn-Cu were used for solder-based assembly of nanonickel interconnections. Low modulus conductive adhesives impart lower stresses in the interconnections...
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