Search results for: L.W.
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 325 - 333
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 119 - 125
IEEE Transactions on Nuclear Science > 2008 > 55 > 6-1 > 3456 - 3460
IEEE Transactions on Nuclear Science > 2008 > 55 > 3-3 > 1708 - 1713
IEEE Transactions on Device and Materials Reliability > 2006 > 6 > 4 > 542 - 549