Search results
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 248 - 254
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 240 - 247
IEEE Electron Device Letters > 2008 > 29 > 5 > 422 - 425
IET Optoelectronics > 2008 > 2 > 1 > 42 - 45
IEEE Electron Device Letters > 2008 > 29 > 7 > 661 - 664