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WLP has been a gradually adopted by the industry during the last years due to its unique characteristics regarding package size and height, package electrical and thermal characteristics and cost. As one of the earlier formats of this wafer level packaging technology, FIWLP is actually its main version with several WLCSP products in HVM since several years, and being adopted in more and more mobile...
Flash-based SSDs are widely used as storage caches, which can benefit from both the higher performance of SSDs and lower price of disks. Unfortunately, issues of reliability and limited lifetime limit the use of Flash-based cache. One way to solve this problem is to use the flash memory as read cache and use other devices like nonvolatile memory for write buffering. In this paper, we propose a new...
AIR 6318 is expected to define a subset of full qualification test procedures for discrete and packaged photonic devices. The test procedures will be aimed at establishing program management confidence in emerging photonic devices prior to Milestone B for subsequent acceptance into EMD.
Exascale computing requires storage systems to provide both reliability and performance, which are in the relationship of trade-off. This paper presents a method to build a zero-overhead network storage system (Cluster-wide RAID), which consists of active storage nodes. Active storage nodes themselves have an ability to process data blocks and our proposed method utilizes them to generate parity blocks...
Photovoltaic plants are complex systems operating in variable conditions. Their performances can be deteriorated by many factors such as shadows and mismatch phenomena. In this case, a suitable device able to control and condition the produced power is needed. A power optimizer could represent an adequate solution since it is capable of regulating the PV generator output impedance to reach the maximum...
Global warming and resource depletion are really affecting us in a lot of ways Solar radiation is a promising source of renewable energy because it is abundant and the technologies to harvest it are quickly improving. However, solar power has a number of problems for implementation; the solar energies mainly depend upon sun availability and the changing climate. The focus on hybrid generation system...
In this paper, a comparison between Single Gate Fully Depleted SOI (SGSOI) and Double Gate Fully Depleted SOI (DGSOI) MOSFET with Si3N4 Spacer (insulator) around the Gate electrode at various different technology nodes are investigated. Simulations are done in ATLAS package of SIVACO tool. Further in this work, study of SON Devices (structure with air in place of buried oxide is termed as Silicon...
Advancements of CMOS technology lead to reduction of the transistor size and operating voltage levels that cause transistors to become more sensitive to cosmic rays. Therefore CMOS devices like memory (i.e., RAMs) are more likely to be hit by transient faults. Up to 77% of the transient faults cause Control Flow Errors (CFEs). One type of CFEs is wrong-successor CFE which is caused by faults in data...
This paper presents an experimental investigation of micro-contact performance (i.e. contact resistance) and reliability (i.e. successful cycles) evaluated under time-varying, low frequency, low amplitude, alternating current (AC) test conditions. Previous research efforts have focused on either on direct current (DC) or high frequency, radio frequency (RF) test conditions. This works attempts to...
The aircraft separation system is mainly made up of explosive device. In order to improve the reliability assessment for the aircraft separation system, the reliability model was established, and a new method of synthetic reliability assessment for the aircraft separation system was proposed. According to the function characteristics of explosive device, the separation system was divided into three...
Arrhenius formula is widely used when accelerated stress needs to be determined in a temperature accelerated test for an electronic device, with “T” denoting temperature in the formula often measured as environment temperature. However, from the point of view of failure mechanisms, the temperature of the point where the failure process takes place should be used as that “T”. Thus two different ways...
The continuous request for higher storage density in Solid State Drives (SSD) is pushing the NAND-Flash technology to their reliability and performance limits. Among many memories technology candidates to replace them the Resistive RAM (RRAM) concept seems to emerge. However, before designing an entire SSD based on RRAM memory devices it must be performed a design space exploration of the disk features...
Nowadays RAID is widely used due to its large capacity, high performance and high reliability. With the increasing requirement of reliability in storage systems and fast development of cloud computing, RAID-6, which can tolerate concurrent failures of any two disks, receives more attention than ever. However, the write performance of RAID-6 systems is a bottleneck to serve various applications. In...
Memory faults are the most common fault in current systems. Strong memory error protection techniques prevent most memory faults from immediately affecting applications and the system, but come at a high and possibly increasing cost as system size increases and fabrication technology continues to scale. To effectively protect against memory faults and errors, a combination of online error-checking...
With the reliability requirements increasingly important, erasure codes have been widely used in today's cloud storage systems because they achieve both high reliability and low storage overhead. However, the performance for most existing erasure codes can be further improved on both normal reads to user's data without device failures and degraded reads under device failures, which are crucial in...
In large storage systems, erasure codes is a primary technique to provide high reliability with low monetary cost. Among various erasure codes, a major category called XORbased codes uses purely XOR operations to generate redundant data and offer low computational complexity. These codes are conventionally implemented via matrix based method or several specialized non-matrix based methods. However,...
We demonstrate the performance and the reliable fabrication process of a 56 Gb/s wavelength-division multiplexing transmitter module with integrated feedback structures. The device is based on microring silicon depletion modulators, optimized for O-band comb-laser operation.
In SSD-based storage systems, persistent data are stored in the NAND Flash and however manipulated in DRAM, causing the decoupled inefficiency. The data being closer to the processors are much easier to be lost due to the volatile property of DRAM, leading to serious data reliability problems. In the meantime, existing SSD technology exploits the properties of NAND Flash and leverages NAND Flash +...
NAND flash memory solid state devices are widely used in many platforms including consumer electronics and safety-critical embedded systems because they offer high performance and reliability. In previous work, we have developed a novel RAID architecture for NAND flash that protects a system from data loss in the case of failure, or wear-out, of individual flash chips. These mechanisms permit the...
This paper venture into prospective ideas of finding the best feasible candidates for future bio-based sensor by exploring an emerging device structure with elevated performance and reliable outcomes of vertical strained impact ionization MOSFET (VESIMOS) with dual strained SiGe and dielectric pocket (DP) technology. An overview of the simulated fabrication process and the performance of the three...
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