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IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2014 > 22 > 1 > 1 - 12
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4299 - 4303
IEEE Journal of the Electron Devices Society > 2014 > 2 > 4 > 65 - 76
IEEE Access > 2014 > 2 > 577 - 601
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 833 - 843
IEEE Journal on Emerging and Selected Topics in Circuits and Systems > 2014 > 4 > 3 > 335 - 343
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3274 - 3281
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 657 - 663
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1575 - 1582
IEEE Transactions on Power Delivery > 2014 > 29 > 3 > 1454 - 1464
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 762 - 768
IEEE Transactions on Power Delivery > 2014 > 29 > 4 > 1970 - 1977
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 884 - 889
2013 International SoC Design Conference (ISOCC) > 356 - 359