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IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 607 - 615
IEEE Transactions on Electron Devices > 2014 > 61 > 3 > 806 - 812
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 507 - 514
Journal of Display Technology > 2013 > 9 > 9 > 747 - 754
IEEE Electron Device Letters > 2013 > 34 > 9 > 1112 - 1114
IEEE Electron Device Letters > 2013 > 34 > 12 > 1476 - 1478
IEEE Transactions on Nuclear Science > 2013 > 60 > 4-1 > 2630 - 2634
IEEE Transactions on Electron Devices > 2013 > 60 > 1 > 396 - 404
IEEE Transactions on Affective Computing > 2012 > 3 > 3 > 366 - 378
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 478 - 481
IEEE Transactions on Semiconductor Manufacturing > 2012 > 25 > 3 > 346 - 354
IEEE Sensors Journal > 2012 > 12 > 5 > 1090 - 1097
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 1 > 58 - 62
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 369 - 375
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1661 - 1667
IEEE Transactions on Applied Superconductivity > 2012 > 22 > 3 > 4901804
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2012 > 59 > 4 > 833 - 839
IEEE Transactions on Systems, Man, and Cybernetics, Part C (Applications... > 2012 > 42 > 6 > 809 - 824
IEEE Electron Device Letters > 2012 > 33 > 3 > 444 - 446
IEEE Transactions on Applied Superconductivity > 2011 > 21 > 3-2 > 1683 - 1687