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IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2092 - 2097
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2244 - 2250
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 142 - 148
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 191 - 197
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2015 > 62 > 6 > 1036 - 1046
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1405 - 1410
IEEE Electron Device Letters > 2015 > 36 > 5 > 472 - 474
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 316 - 323
IEEE Transactions on Electromagnetic Compatibility > 2014 > 56 > 1 > 44 - 50
IEEE Transactions on Power Systems > 2014 > 29 > 1 > 251 - 258
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2014 > 61 > 4 > 647 - 653
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2473 - 2479
IEEE Electron Device Letters > 2014 > 35 > 7 > 783 - 785
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 6 > 1010 - 1014
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 833 - 843
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 3991 - 3999
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3613 - 3618
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3081 - 3089
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 657 - 663