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IEEE Access > 2017 > 5 > 10594 - 10604
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 522 - 531
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 8 > 1 - 7
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4409 - 4415
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 4038 - 4045
Journal of Display Technology > 2016 > 12 > 8 > 859 - 868
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 4 > 1 - 6
IEEE Transactions on Dielectrics and Electrical Insulation > 2016 > 23 > 3 > 1820 - 1828
IEEE Transactions on Electron Devices > 2016 > 63 > 6 > 2367 - 2373
IEEE Transactions on Power Systems > 2016 > 31 > 3 > 2116 - 2124
IEEE Transactions on Affective Computing > 2016 > 7 > 2 > 150 - 161
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 3 > 1 - 7
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 946 - 953
Journal of Microelectromechanical Systems > 2016 > 25 > 1 > 188 - 196
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 4-3 > 1 - 6
IEEE Transactions on Electron Devices > 2015 > 62 > 12 > 4044 - 4050
IEEE Transactions on Magnetics > 2015 > 51 > 11 > 1 - 4
IEEE Transactions on Magnetics > 2015 > 51 > 11 > 1 - 4
IEEE Transactions on Software Engineering > 2015 > 41 > 11 > 1091 - 1118