Search results
Journal of Microelectromechanical Systems > 2012 > 21 > 6 > 1303 - 1310
IEEE Sensors Journal > 2012 > 12 > 5 > 1246 - 1252
IEEE Transactions on Industrial Electronics > 2012 > 59 > 2 > 1105 - 1113
IEEE Transactions on Dielectrics and Electrical Insulation > 2012 > 19 > 2 > 521 - 532
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1928 - 1935
IEEE Transactions on Electron Devices > 2012 > 59 > 6 > 1750 - 1756
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2012 > 59 > 5 > 1043 - 1060
IEEE Electron Device Letters > 2012 > 33 > 3 > 429 - 431
IEEE Transactions on Dielectrics and Electrical Insulation > 2012 > 19 > 1 > 140 - 149
IEEE Transactions on Dielectrics and Electrical Insulation > 2012 > 19 > 1 > 247 - 252
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 194 - 200
IEEE Electron Device Letters > 2011 > 32 > 6 > 707 - 709
IEEE Electron Device Letters > 2011 > 32 > 3 > 363 - 365
IEEE Transactions on Electron Devices > 2011 > 58 > 12 > 4344 - 4353
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2011 > 58 > 10 > 2222 - 2238
IEEE/ASME Transactions on Mechatronics > 2011 > 16 > 1 > 102 - 107
IEEE Transactions on Applied Superconductivity > 2011 > 21 > 3-2 > 1348 - 1353
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2011 > 58 > 4 > 829 - 837
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1311 - 1318
IEEE Transactions on Dielectrics and Electrical Insulation > 2011 > 18 > 4 > 990 - 996