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IEEE Transactions on Electron Devices > 2010 > 57 > 1 > 228 - 237
IEEE Electron Device Letters > 2010 > 31 > 6 > 525 - 527
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2010 > 29 > 5 > 722 - 736
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-1 > 1842 - 1848
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 2073 - 2080
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 459 - 464
IEEE Transactions on Applied Superconductivity > 2009 > 19 > 6 > 3779 - 3785
IEEE Electron Device Letters > 2009 > 30 > 9 > 972 - 974
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1166 - 1176
IEEE Transactions on Semiconductor Manufacturing > 2009 > 22 > 1 > 59 - 65
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1277 - 1283
IEEE Electron Device Letters > 2008 > 29 > 2 > 192 - 194
Ieee transactions on components and packaging technologies > 2008 > 31 > 1 > 135 - 142
IEEE Transactions on Electron Devices > 2008 > 55 > 4 > 997 - 1004
IEEE Transactions on Magnetics > 2008 > 44 > 11-1 > 2487 - 2490
IEEE Transactions on Instrumentation and Measurement > 2008 > 57 > 8 > 1786 - 1790
IEEE Sensors Journal > 2008 > 8 > 8 > 1455 - 1468
IEEE Electron Device Letters > 2008 > 29 > 7 > 750 - 752
IEEE Electron Device Letters > 2008 > 29 > 7 > 808 - 810
IEEE Electron Device Letters > 2008 > 29 > 9 > 1071 - 1073