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IEEE Electron Device Letters > 2009 > 30 > 11 > 1185 - 1187
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 1991 - 1998
IEEE Transactions on Nuclear Science > 2009 > 56 > 4-2 > 1964 - 1970
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1166 - 1176
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1086 - 1093
IEEE Transactions on Electron Devices > 2009 > 56 > 4 > 678 - 682
IEEE Transactions on Industrial Electronics > 2009 > 56 > 8 > 3096 - 3105
IEEE Transactions on Electron Devices > 2009 > 56 > 1 > 109 - 115
IEEE Electron Device Letters > 2009 > 30 > 1 > 54 - 56
IEEE Electron Device Letters > 2009 > 30 > 4 > 401 - 403
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 128 - 134
IEEE Transactions on Electron Devices > 2009 > 56 > 2 > 267 - 274
IEEE Transactions on Electron Devices > 2009 > 56 > 2 > 236 - 242
IEEE Electron Device Letters > 2009 > 30 > 3 > 250 - 253
IEEE Transactions on Electron Devices > 2009 > 56 > 6 > 1277 - 1283
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 203 - 208
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1063 - 1069
IEEE Transactions on Electron Devices > 2009 > 56 > 5 > 1056 - 1062
IEEE Transactions on Electron Devices > 2009 > 56 > 4 > 620 - 626
IEEE Electron Device Letters > 2009 > 30 > 4 > 413 - 415