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IEEE Transactions on Instrumentation and Measurement > 2010 > 59 > 6 > 1734 - 1742
IEEE Transactions on Electron Devices > 2010 > 57 > 6 > 1343 - 1354
IEEE Transactions on Power Electronics > 2010 > 25 > 9 > 2397 - 2408
IEEE Transactions on Electron Devices > 2010 > 57 > 7 > 1706 - 1709
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 3 > 317 - 323
IEEE Transactions on Semiconductor Manufacturing > 2010 > 23 > 4 > 538 - 544
IEEE Electron Device Letters > 2010 > 31 > 9 > 1029 - 1031
IEEE Transactions on Electron Devices > 2010 > 57 > 2 > 482 - 490
IEEE Transactions on Power Electronics > 2010 > 25 > 7 > 1685 - 1691
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 2 > 174 - 181
Solid State Electronics > 2009 > 53 > 8 > 880-887
Solid State Electronics > 2009 > 53 > 7 > 712-716
IEEE Electron Device Letters > 2009 > 30 > 9 > 978 - 980
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 4 > 537 - 556
IEEE Electron Device Letters > 2009 > 30 > 8 > 840 - 842
IEEE Transactions on Electron Devices > 2009 > 56 > 9 > 1943 - 1952
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 459 - 464
IEEE Transactions on Electron Devices > 2009 > 56 > 8 > 1618 - 1623
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 3 > 454 - 458
IEEE Transactions on Electron Devices > 2009 > 56 > 11 > 2848 - 2852