Search results
IEEE Electron Device Letters > 2011 > 32 > 3 > 408 - 410
IEEE Transactions on Electron Devices > 2011 > 58 > 2 > 384 - 391
IEEE Electron Device Letters > 2011 > 32 > 1 > 81 - 83
IEEE Transactions on Electron Devices > 2011 > 58 > 1 > 39 - 45
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 800 - 807
IEEE Electron Device Letters > 2011 > 32 > 3 > 294 - 296
IEEE Electron Device Letters > 2011 > 32 > 4 > 488 - 490
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1490 - 1498
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 290 - 294
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1583 - 1593
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1614 - 1619
IEEE Electron Device Letters > 2011 > 32 > 5 > 584 - 586
IEEE Electron Device Letters > 2011 > 32 > 5 > 605 - 607
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1189 - 1196
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 126 - 130
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 118 - 125
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 92 - 97
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2061 - 2071
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 1914 - 1921
IEEE Electron Device Letters > 2011 > 32 > 10 > 1337 - 1339