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IEEE Electron Device Letters > 2014 > 35 > 2 > 181 - 183
IEEE Transactions on Electron Devices > 2013 > 60 > 11 > 3663 - 3668
IEEE Transactions on Electron Devices > 2013 > 60 > 8 > 2505 - 2511
IEEE Transactions on Device and Materials Reliability > 2013 > 13 > 4 > 524 - 533
IEEE Electron Device Letters > 2013 > 34 > 12 > 1476 - 1478
IEEE Sensors Journal > 2013 > 13 > 10 > 3892 - 3900
IEEE Transactions on Electron Devices > 2012 > 59 > 4 > 1013 - 1022
IEEE Transactions on Electron Devices > 2012 > 59 > 8 > 2093 - 2099
IEEE Journal of Solid-State Circuits > 2012 > 47 > 5 > 1075 - 1083
IEEE Electron Device Letters > 2012 > 33 > 4 > 486 - 488
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3133 - 3136
IEEE Electron Device Letters > 2012 > 33 > 2 > 137 - 139
IEEE Electron Device Letters > 2012 > 33 > 3 > 438 - 440
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 1023 - 1028
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 194 - 200
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 1 > 44 - 49
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1517 - 1522
IEEE Transactions on Device and Materials Reliability > 2011 > 11 > 2 > 349 - 357
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1476 - 1482
IEEE Electron Device Letters > 2011 > 32 > 6 > 707 - 709