Search results
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1179 - 1183
IEEE Transactions on Reliability > 2016 > 65 > 1 > 370 - 380
IEEE Transactions on Reliability > 2016 > 65 > 1 > 469 - 485
IEEE Transactions on Reliability > 2016 > 65 > 1 > 446 - 458
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1274 - 1280
IEEE Transactions on Nanotechnology > 2016 > 15 > 2 > 274 - 280
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1148 - 1153
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 101 - 104
Journal of Display Technology > 2016 > 12 > 3 > 263 - 267
Journal of Display Technology > 2016 > 12 > 3 > 232 - 239
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 755 - 759
IEEE Electron Device Letters > 2016 > 37 > 2 > 228 - 230
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 2 > 306 - 313
IEEE Journal of Photovoltaics > 2016 > 6 > 1 > 252 - 257
IEEE Transactions on Power Electronics > 2016 > 31 > 12 > 8371 - 8386
IEEE Transactions on Reliability > 2015 > 64 > 4 > 1325 - 1339
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 629 - 632
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 500 - 510
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 11 > 1573 - 1581