Search results
IEEE Transactions on Reliability > 2017 > 66 > 4 > 989 - 996
IEEE Transactions on Power Electronics > 2017 > 32 > 12 > 9435 - 9446
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 11 > 3138 - 3151
IEEE Transactions on Power Electronics > 2017 > 32 > 11 > 8718 - 8727
Journal of Electronic Materials > 2018 > 47 > 1 > 142-147
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 10 > 1634 - 1643
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3748 - 3755
IEEE Transactions on Electron Devices > 2017 > 64 > 9 > 3639 - 3646
IEEE Electron Device Letters > 2017 > 38 > 9 > 1252 - 1255
IEEE Transactions on Reliability > 2017 > 66 > 3 > 641 - 650
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 9 > 2561 - 2574
IEEE Transactions on Industry Applications > 2017 > 53 > 5 > 4788 - 4795
IEEE Transactions on Reliability > 2017 > 66 > 3 > 662 - 676
IEEE Journal of Emerging and Selected Topics in Power Electronics > 2017 > 5 > 3 > 1122 - 1132
Case Studies in Thermal Engineering > 2017 > 10 > C > 207-215
IEEE Transactions on Electron Devices > 2017 > 64 > 8 > 3189 - 3192
IEEE Transactions on Power Electronics > 2017 > 32 > 8 > 6434 - 6443
IEEE Transactions on Sustainable Energy > 2017 > 8 > 3 > 953 - 965
SID Symposium Digest of Technical Papers > 48 > 1 > 1524 - 1527
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 281 - 290