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IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3552 - 3557
IEEE Transactions on Dielectrics and Electrical Insulation > 2016 > 23 > 4 > 2404 - 2412
IEEE Transactions on Semiconductor Manufacturing > 2016 > 29 > 3 > 193 - 200
Journal of Microelectromechanical Systems > 2016 > 25 > 3 > 549 - 556
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 4 > 1 - 6
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 4 > 1 - 6
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 2 > 213 - 219
IEEE Transactions on Industry Applications > 2016 > 52 > 3 > 2554 - 2563
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1910 - 1915
IEEE Transactions on Terahertz Science and Technology > 2016 > 6 > 3 > 435 - 441
IEEE Transactions on Electron Devices > 2016 > 63 > 5 > 1899 - 1903
IEEE Electron Device Letters > 2016 > 37 > 4 > 369 - 372
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 3 > 1 - 4
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1459 - 1463
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1054 - 1058
IEEE Transactions on Reliability > 2016 > 65 > 1 > 256 - 262
Journal of Lightwave Technology > 2016 > 34 > 4 > 1220 - 1227
IEEE Electron Device Letters > 2016 > 37 > 1 > 84 - 87
IEEE Electron Device Letters > 2016 > 37 > 6 > 735 - 738