Wyniki wyszukiwania
IEEE Electron Device Letters > 2016 > 37 > 4 > 369 - 372
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2016 > 63 > 3 > 486 - 505
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 755 - 759
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3222 - 3228
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3799 - 3804
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 4 > 454 - 460
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 10 > 2065 - 2076
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 9 > 1265 - 1272
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 308 - 318
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 229 - 235
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 601 - 605
IEEE Transactions on Power Delivery > 2015 > 30 > 1 > 437 - 444
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 57 - 65
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 471 - 476
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2243 - 2249
IEEE Transactions on Dielectrics and Electrical Insulation > 2014 > 21 > 3 > 1243 - 1250
IEEE Electron Device Letters > 2014 > 35 > 9 > 927 - 929
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2619 - 2627
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3090 - 3095