Search results
IEEE Transactions on Magnetics > 2008 > 44 > 1-2 > 100 - 103
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 2 > 394 - 405
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 689 - 693
IEEE Transactions on Magnetics > 2008 > 44 > 11-1 > 2581 - 2584
IEEE Transactions on Dielectrics and Electrical Insulation > 2008 > 15 > 6 > 1691 - 1700
IEEE Transactions on Magnetics > 2008 > 44 > 11-1 > 2589 - 2591
IEEE Sensors Journal > 2008 > 8 > 7 > 1264 - 1267
IEEE Transactions on Electron Devices > 2008 > 55 > 10 > 2790 - 2794
IEEE Transactions on Dielectrics and Electrical Insulation > 2008 > 15 > 4 > 965 - 973
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 3 > 438 - 445
IEEE Transactions on Applied Superconductivity > 2007 > 17 > 2-2 > 1743 - 1747
IEEE Transactions on Electron Devices > 2007 > 54 > 11 > 2860 - 2870
IEEE Transactions on Electron Devices > 2007 > 54 > 10 > 2669 - 2678
IEEE Transactions on Dielectrics and Electrical Insulation > 2005 > 12 > 1 > 11 - 16
IEEE Electrical Insulation Magazine > 2002 > 18 > 3 > 18 - 31
IEEE Translation Journal on Magnetics in Japan > 1994 > 9 > 2 > 124 - 129