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IEEE Electron Device Letters > 2012 > 33 > 1 > 110 - 112
IEEE Transactions on Power Systems > 2012 > 27 > 2 > 993 - 1002
IEEE Transactions on Dielectrics and Electrical Insulation > 2012 > 19 > 2 > 460 - 471
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 272 - 284
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2012 > 2 > 4 > 617 - 624
IEEE Transactions on Control Systems Technology > 2012 > 20 > 5 > 1275 - 1284
IEEE Transactions on Industry Applications > 2012 > 48 > 1 > 161 - 171
IEEE Transactions on Electron Devices > 2012 > 59 > 7 > 1928 - 1935
IEEE Transactions on Reliability > 2012 > 61 > 2 > 361 - 377
IEEE Transactions on Magnetics > 2012 > 48 > 9 > 2488 - 2494
IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control > 2012 > 59 > 1 > 156 - 162
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2012 > 2 > 3 > 439 - 447
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 610 - 620
IEEE Transactions on Reliability > 2012 > 61 > 2 > 590 - 603
IEEE Transactions on Medical Imaging > 2011 > 30 > 4 > 990 - 1000
IEEE Transactions on Electron Devices > 2011 > 58 > 5 > 1517 - 1522
IEEE Transactions on Nuclear Science > 2011 > 58 > 3-2 > 770 - 775
IEEE Transactions on Nanotechnology > 2011 > 10 > 6 > 1321 - 1327
IEEE Sensors Journal > 2011 > 11 > 11 > 2649 - 2656