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IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 308 - 318
IEEE Transactions on Reliability > 2015 > 64 > 3 > 949 - 959
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 342 - 351
IEEE Transactions on Semiconductor Manufacturing > 2015 > 28 > 3 > 221 - 226
IEEE Transactions on Electron Devices > 2015 > 62 > 8 > 2549 - 2554
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2015 > 23 > 7 > 1360 - 1364
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2244 - 2250
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2148 - 2154
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2084 - 2091
IEEE Transactions on Applied Superconductivity > 2015 > 25 > 3-3 > 1 - 5
IEEE Transactions on Reliability > 2015 > 64 > 2 > 603 - 612
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 198 - 205
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2015 > 34 > 6 > 947 - 960
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 191 - 197
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 236 - 241
IEEE Electron Device Letters > 2015 > 36 > 6 > 579 - 581
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2015 > 5 > 6 > 755 - 761
IEEE Transactions on Electron Devices > 2015 > 62 > 6 > 1811 - 1818
IEEE Transactions on Nuclear Science > 2015 > 62 > 3-3 > 1255 - 1261
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1405 - 1410