Search results
IEEE Electron Device Letters > 2016 > 37 > 4 > 369 - 372
IEEE Electron Device Letters > 2016 > 37 > 4 > 474 - 477
IEEE Electron Device Letters > 2016 > 37 > 4 > 385 - 388
IEEE Electron Device Letters > 2016 > 37 > 4 > 366 - 368
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1644 - 1649
IEEE Transactions on Applied Superconductivity > 2016 > 26 > 3 > 1 - 7
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1459 - 1463
IEEE Transactions on Reliability > 2016 > 65 > 1 > 459 - 468
IEEE Transactions on Nanotechnology > 2016 > 15 > 2 > 137 - 148
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 3 > 1179 - 1183
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 98 - 100
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 50 - 60
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1274 - 1280
IEEE Transactions on Nanotechnology > 2016 > 15 > 2 > 274 - 280
IEEE Transactions on Electron Devices > 2016 > 63 > 3 > 1054 - 1058
Journal of Display Technology > 2016 > 12 > 3 > 232 - 239
IEEE Transactions on Reliability > 2016 > 65 > 1 > 256 - 262
IEEE Electron Device Letters > 2016 > 37 > 2 > 176 - 178
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 723 - 730
IEEE Journal of Photovoltaics > 2016 > 6 > 1 > 252 - 257