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IEEE Access > 2017 > 5 > 5690 - 5701
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 597 - 603
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 5068 - 5071
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 522 - 531
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4346 - 4351
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4409 - 4415
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4331 - 4338
IEEE Electron Device Letters > 2016 > 37 > 11 > 1415 - 1417
IEEE Transactions on Parallel and Distributed Systems > 2016 > 27 > 11 > 3283 - 3297
IEEE Journal of Photovoltaics > 2016 > 6 > 6 > 1635 - 1640
IEEE Transactions on Industry Applications > 2016 > 52 > 6 > 5009 - 5018
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 4038 - 4045
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3830 - 3836
IEEE Transactions on Electron Devices > 2016 > 63 > 10 > 3964 - 3970
Journal of Display Technology > 2016 > 12 > 10 > 1078 - 1082
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 290 - 297
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3479 - 3486
IEEE Transactions on Electron Devices > 2016 > 63 > 9 > 3487 - 3492
IEEE Transactions on Reliability > 2016 > 65 > 3 > 1284 - 1297
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 282 - 289