Search results
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 1 > 101 - 104
Journal of Display Technology > 2016 > 12 > 3 > 263 - 267
Journal of Display Technology > 2016 > 12 > 3 > 232 - 239
IEEE Electron Device Letters > 2016 > 37 > 2 > 176 - 178
IEEE Electron Device Letters > 2016 > 37 > 2 > 157 - 160
IEEE Electron Device Letters > 2016 > 37 > 2 > 130 - 133
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 598 - 605
IEEE Electron Device Letters > 2016 > 37 > 2 > 228 - 230
IEEE Electron Device Letters > 2016 > 37 > 1 > 74 - 76
IEEE Electron Device Letters > 2016 > 37 > 1 > 39 - 42
IEEE Electron Device Letters > 2016 > 37 > 1 > 88 - 91
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 1 > 125 - 132
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3222 - 3228
IEEE Electron Device Letters > 2016 > 37 > 6 > 735 - 738
IEEE Electron Device Letters > 2016 > 37 > 6 > 728 - 730
IEEE Electron Device Letters > 2015 > 36 > 12 > 1267 - 1270
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Electron Device Letters > 2015 > 36 > 12 > 1336 - 1339
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 567 - 575
IEEE Transactions on Electron Devices > 2015 > 62 > 11 > 3697 - 3702