Search results
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1307 - 1315
IEEE Transactions on Semiconductor Manufacturing > 2014 > 27 > 3 > 410 - 416
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2014 > 4 > 8 > 1303 - 1308
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2928 - 2934
IEEE Electron Device Letters > 2014 > 35 > 8 > 859 - 861
IEEE Transactions on Electron Devices > 2014 > 61 > 7 > 2271 - 2277
IEEE Electron Device Letters > 2014 > 35 > 7 > 714 - 716
IEEE Transactions on Electron Devices > 2014 > 61 > 8 > 2647 - 2655
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 3 > 878 - 883
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 1041 - 1048
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3808 - 3813
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3751 - 3756
IEEE Electron Device Letters > 2014 > 35 > 12 > 1293 - 1295
IEEE Journal of Photovoltaics > 2014 > 4 > 5 > 1228 - 1234
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3090 - 3095
IEEE Transactions on Nanotechnology > 2014 > 13 > 6 > 1084 - 1087
IEEE Transactions on Electron Devices > 2014 > 61 > 9 > 3206 - 3212
IEEE Electron Device Letters > 2014 > 35 > 10 > 983 - 985
IEEE Electron Device Letters > 2014 > 35 > 10 > 1004 - 1006
IEEE Transactions on Electron Devices > 2014 > 61 > 5 > 1222 - 1230