Wyniki wyszukiwania
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 340 - 348
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 6 > 819 - 828
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 2 > 422 - 431
IEEE Transactions on Semiconductor Manufacturing > 2017 > 30 > 2 > 143 - 154
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2038 - 2046
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2099 - 2105
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2092 - 2098
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 5 > 802 - 805
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 5 > 1774 - 1781
IEEE Photonics Journal > 2017 > 9 > 2 > 1 - 15
Journal of Microelectromechanical Systems > 2017 > 26 > 2 > 406 - 414
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 3 > 338 - 344
IEEE Electron Device Letters > 2017 > 38 > 3 > 345 - 348
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1007 - 1014
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 945 - 952
IEEE Transactions on Nanotechnology > 2017 > 16 > 2 > 209 - 216
IEEE Sensors Journal > 2017 > 17 > 5 > 1255 - 1263
Journal of Microelectromechanical Systems > 2017 > 26 > 1 > 179 - 186
Journal of Microelectromechanical Systems > 2017 > 26 > 1 > 235 - 245
Journal of Microelectromechanical Systems > 2017 > 26 > 1 > 158 - 168