Search results
IEEE Transactions on Plasma Science > 2017 > 45 > 12-2 > 3218 - 3223
IEEE Transactions on Plasma Science > 2017 > 45 > 12-1 > 3062 - 3063
IEEE Transactions on Plasma Science > 2017 > 45 > 12-2 > 3147 - 3153
IEEE Power and Energy Technology Systems Journal > 2017 > 4 > 4 > 84 - 93
IEEE Journal of Solid-State Circuits > 2017 > 52 > 12 > 3155 - 3167
IEEE Transactions on Plasma Science > 2017 > 45 > 12-1 > 3070 - 3075
IEEE Transactions on Plasma Science > 2017 > 45 > 12-1 > 3089 - 3093
IEEE Transactions on Plasma Science > 2017 > 45 > 12-1 > 3076 - 3081
IEEE Transactions on Plasma Science > 2017 > 45 > 12-2 > 3231 - 3239
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3341 - 3354
Electronics Letters > 2017 > 53 > 23 > 1518 - 1520
IEEE Transactions on Plasma Science > 2017 > 45 > 11 > 2988 - 2993
IEEE Transactions on Plasma Science > 2017 > 45 > 11 > 2984 - 2987
IEEE Transactions on Plasma Science > 2017 > 45 > 11 > 3042 - 3045
IEEE Electron Device Letters > 2017 > 38 > 11 > 1610 - 1613
IEEE Transactions on Industry Applications > 2017 > 53 > 6 > 5875 - 5882
IEEE Transactions on Plasma Science > 2017 > 45 > 11 > 2974 - 2978
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4644 - 4649
IEEE Electron Device Letters > 2017 > 38 > 11 > 1602 - 1605
IEEE Industry Applications Magazine > 2017 > 23 > 6 > 14 - 20