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IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 10 > 1628 - 1638
IEEE Transactions on Magnetics > 2016 > 52 > 10 > 1 - 10
Journal of Microelectromechanical Systems > 2016 > 25 > 5 > 954 - 962
IEEE Transactions on Circuits and Systems I: Regular Papers > 2016 > 63 > 10 > 1592 - 1604
IEEE Journal of Solid-State Circuits > 2016 > 51 > 10 > 2357 - 2367
IEEE Transactions on Electromagnetic Compatibility > 2016 > 58 > 5 > 1609 - 1616
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2016 > 24 > 10 > 3184 - 3192
IEEE Design & Test > 2016 > 33 > 5 > 28 - 34
IEEE Journal of Solid-State Circuits > 2016 > 51 > 10 > 2274 - 2286
Electronics Letters > 2016 > 52 > 20 > 1667 - 1669
Electronics Letters > 2016 > 52 > 20 > 1707 - 1708
Electronics Letters > 2016 > 52 > 20 > 1660 - 1661
Electronics Letters > 2016 > 52 > 19 > 1592 - 1594
Electronics Letters > 2016 > 52 > 18 > 1567 - 1569
Electronics Letters > 2016 > 52 > 18 > 1554 - 1555
IEEE Micro > 2016 > 36 > 5 > 50 - 61
IEEE Electron Device Letters > 2016 > 37 > 9 > 1120 - 1122
IEEE Journal of Solid-State Circuits > 2016 > 51 > 9 > 2077 - 2090
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 3 > 290 - 297