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IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4084 - 4090
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 4260 - 4265
IEEE Electron Device Letters > 2017 > 38 > 10 > 1496 - 1499
IEEE Design & Test > 2017 > 34 > 5 > 63 - 71
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 10 > 2893 - 2906
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 5 > 1087 - 1096
IEEE Transactions on Magnetics > 2017 > 53 > 10 > 1 - 13
IEEE Transactions on Circuits and Systems I: Regular Papers > 2017 > 64 > 10 > 2679 - 2690
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 10 > 4002 - 4013
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 10 > 1172 - 1176
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 10 > 3892 - 3902
IEEE Transactions on Electromagnetic Compatibility > 2017 > 59 > 5 > 1646 - 1649
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 10 > 3922 - 3936
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 10 > 3910 - 3921
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 10 > 3962 - 3974
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 10 > 3937 - 3949
IEEE Transactions on Power Electronics > 2017 > 32 > 10 > 7739 - 7749
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 10 > 1162 - 1166
IEEE Transactions on Power Electronics > 2017 > 32 > 10 > 7845 - 7850
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 9 > 1007 - 1011