Search results
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 809 - 815
IEEE Electron Device Letters > 2017 > 38 > 3 > 399 - 402
IEEE Transactions on Electron Devices > 2017 > 64 > 2 > 515 - 520
IEEE Electron Device Letters > 2017 > 38 > 2 > 244 - 247
IEEE Sensors Journal > 2017 > 17 > 1 > 7 - 13
IEEE Journal of the Electron Devices Society > 2017 > 5 > 1 > 53 - 58
IEEE Transactions on Nanotechnology > 2017 > 16 > 1 > 3 - 10
IEEE Transactions on Terahertz Science and Technology > 2017 > 7 > 2 > 184 - 190
IEEE Sensors Journal > 2016 > 16 > 24 > 8865 - 8873
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 622 - 630
IEEE Transactions on Electron Devices > 2016 > 63 > 12 > 4880 - 4887
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 12 > 1766 - 1775
IEEE Transactions on Plasma Science > 2016 > 44 > 12-2 > 3099 - 3106
IEEE Transactions on Electron Devices > 2016 > 63 > 11 > 4542 - 4545
IEEE Transactions on Nanotechnology > 2016 > 15 > 6 > 971 - 976
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 11 > 1587 - 1594
IEEE Microwave and Wireless Components Letters > 2016 > 26 > 10 > 756 - 758
IEEE Transactions on Microwave Theory and Techniques > 2016 > 64 > 10 > 3187 - 3197
IEEE Photonics Technology Letters > 2016 > 28 > 18 > 1996 - 1999
IEEE Transactions on Instrumentation and Measurement > 2016 > 65 > 9 > 2137 - 2144