Search results
IEEE Electron Device Letters > 2017 > 38 > 12 > 1716 - 1719
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5181 - 5187
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5121 - 5127
IEEE Power Electronics Magazine > 2017 > 4 > 4 > 24 - 32
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 6 > 1413 - 1421
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 763 - 772
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5104 - 5112
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-1 > 4836 - 4842
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-1 > 4953 - 4959
Journal of Microelectromechanical Systems > 2017 > 26 > 6 > 1244 - 1247
IEEE Journal of Emerging and Selected Topics in Power Electronics > 2017 > 5 > 4 > 1746 - 1760
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3291 - 3301
IEEE Transactions on Industrial Electronics > 2017 > 64 > 12 > 9233 - 9242
IEEE Transactions on Energy Conversion > 2017 > 32 > 4 > 1407 - 1417
IEEE Transactions on Energy Conversion > 2017 > 32 > 4 > 1367 - 1375
IEEE Transactions on Energy Conversion > 2017 > 32 > 4 > 1479 - 1491
IEEE Journal of Emerging and Selected Topics in Power Electronics > 2017 > 5 > 4 > 1787 - 1796
IEEE Transactions on Energy Conversion > 2017 > 32 > 4 > 1562 - 1573
IEEE Transactions on Energy Conversion > 2017 > 32 > 4 > 1356 - 1366
IEEE Transactions on Power Electronics > 2017 > 32 > 12 > 9355 - 9363