Search results
IEEE Electron Device Letters > 2017 > 38 > 12 > 1708 - 1711
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5270 - 5273
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5223 - 5229
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4875 - 4881
IEEE Vehicular Technology Magazine > 2017 > 12 > 4 > 50 - 59
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 780 - 784
IEEE Electron Device Letters > 2017 > 38 > 12 > 1676 - 1679
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3355 - 3368
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 12 > 3509 - 3520
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 6 > 1335 - 1343
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 6 > 1278 - 1289
IEEE Internet of Things Journal > 2017 > 4 > 6 > 2116 - 2128
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5081 - 5086
IEEE Electron Device Letters > 2017 > 38 > 12 > 1704 - 1707
IEEE Transactions on Applied Superconductivity > 2017 > 27 > 8 > 1 - 7
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5230 - 5235
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4897 - 4903
IEEE Electron Device Letters > 2017 > 38 > 12 > 1751 - 1754
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5212 - 5222