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IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5217 - 5222
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4850 - 4855
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5284 - 5287
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4965 - 4973
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5057 - 5064
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5279 - 5283
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5242 - 5248
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4831 - 4837
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4937 - 4945
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5263 - 5269
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4838 - 4843
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4974 - 4979
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4985 - 4991
IEEE Internet of Things Journal > 2017 > 4 > 6 > 2186 - 2198
IEEE Transactions on Circuits and Systems II: Express Briefs > 2017 > 64 > 12 > 1362 - 1366
IEEE Electron Device Letters > 2017 > 38 > 12 > 1712 - 1715
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5274 - 5278
IEEE Electron Device Letters > 2017 > 38 > 12 > 1759 - 1762
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4889 - 4896