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2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-4.1 - 6A-4.7
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 916 - 922
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 659 - 673
IEEE Electron Device Letters > 2017 > 38 > 2 > 157 - 159
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 367 - 373
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 544 - 549
IEEE Solid-State Circuits Magazine > 2017 > 9 > 4 > 18 - 26
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2115 - 2121
2016 IEEE International Electron Devices Meeting (IEDM) > 32.6.1 - 32.6.4
2016 IEEE International Electron Devices Meeting (IEDM) > 2.2.1 - 2.2.4
2016 IEEE International Electron Devices Meeting (IEDM) > 17.7.1 - 17.7.4
IEEE Journal of the Electron Devices Society > 2016 > 4 > 6 > 379 - 386
IET Circuits, Devices & Systems > 2016 > 10 > 6 > 497 - 503