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IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5181 - 5187
IEEE Electron Device Letters > 2017 > 38 > 12 > 1696 - 1699
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4952 - 4958
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 6 > 1271 - 1277
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5188 - 5193
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5163 - 5171
IEEE Electron Device Letters > 2017 > 38 > 12 > 1680 - 1683
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4904 - 4909
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5093 - 5098
IEEE Electron Device Letters > 2017 > 38 > 12 > 1657 - 1660
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5209 - 5216
IEEE Electron Device Letters > 2017 > 38 > 12 > 1653 - 1656
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5256 - 5262
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 4910 - 4918
IEEE Vehicular Technology Magazine > 2017 > 12 > 4 > 40 - 49
IEEE Sensors Letters > 2017 > 1 > 6 > 1 - 4
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5171 - 5180
IEEE Transactions on Electron Devices > 2017 > 64 > 12 > 5073 - 5080
IEEE Transactions on Microwave Theory and Techniques > 2017 > 65 > 12-2 > 5203 - 5211
IEEE Sensors Letters > 2017 > 1 > 6 > 1 - 4