Search results
IEEE Transactions on Power Electronics > 2017 > 32 > 5 > 3787 - 3796
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2135 - 2141
IEEE Transactions on Electron Devices > 2017 > 64 > 5 > 2166 - 2171
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1619 - 1623
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1498 - 1504
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 1045 - 1052
IEEE Transactions on Reliability > 2017 > 66 > 1 > 233 - 244
IEEE Transactions on Reliability > 2017 > 66 > 1 > 245 - 256
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 2 > 769 - 773
IEEE Electron Device Letters > 2017 > 38 > 2 > 203 - 206