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IEEE Communications Letters > 2017 > 21 > 1 > 60 - 63
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 532 - 540
IEEE Transactions on Plasma Science > 2016 > 44 > 12-3 > 3439 - 3444
IEEE Communications Letters > 2017 > 21 > 1 > 60 - 63
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 532 - 540
IEEE Transactions on Plasma Science > 2016 > 44 > 12-3 > 3439 - 3444