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IEEE Access > 2017 > 5 > 5678 - 5689
IEEE Electron Device Letters > 2016 > 37 > 12 > 1543 - 1546
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 610 - 616
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 647 - 666
2016 IEEE International Electron Devices Meeting (IEDM) > 17.1.1 - 17.1.4
2016 IEEE International Electron Devices Meeting (IEDM) > 33.4.1 - 33.4.4
2016 IEEE International Electron Devices Meeting (IEDM) > 31.5.1 - 31.5.4
2016 IEEE International Electron Devices Meeting (IEDM) > 32.2.1 - 32.2.4
2016 IEEE International Electron Devices Meeting (IEDM) > 11.1.1 - 11.1.4