Wyniki wyszukiwania
Journal of Computational Electronics > 2017 > 16 > 2 > 307-315
Microelectronics Reliability > 2017 > 71 > Complete > 82-85
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-3.1 - 6A-3.8
IEEE Electron Device Letters > 2017 > 38 > 4 > 477 - 480
Superlattices and Microstructures > 2017 > 104 > C > 470-476
IEEE Transactions on Electron Devices > 2017 > 64 > 3 > 735 - 740