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2016 IEEE International Reliability Physics Symposium (IRPS) > SE-5-1 - SE-5-6
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 4 > 586 - 597
Microelectronics Journal > 2016 > 50 > C > 8-19
IEEE Transactions on Computer-Aided Design of Integrated Circuits and... > 2016 > 35 > 3 > 380 - 393
IEEE Transactions on Nanotechnology > 2016 > 15 > 2 > 129 - 136
Integration, the VLSI Journal > 2016 > 53 > C > 14-26
IEEE Transactions on Nuclear Science > 2016 > 63 > 1-2 > 385 - 391
Journal of Electronic Testing > 2016 > 32 > 3 > 291-305
Journal of Electronic Testing > 2016 > 32 > 1 > 97-103
The Journal of Supercomputing > 2016 > 72 > 4 > 1363-1380
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2666 - 2672
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2578 - 2584
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2570 - 2577
Microelectronics Reliability > 2015 > 55 > 11 > 2423-2438
Microelectronics Reliability > 2015 > 55 > 11 > 2468-2480
Microelectronics Reliability > 2015 > 55 > 11 > 2439-2452