Search results
Microelectronics Reliability > 2017 > 69 > C > 109-114
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 483 - 490
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 471 - 476
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 367 - 373
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-2 > 689 - 696
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2188 - 2195
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2219 - 2226
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 353 - 358
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 1 > 247 - 260
Procedia Computer Science > 2017 > 107 > C > 313-318
IEEE Transactions on Nuclear Science > 2016 > 63 > 6 > 3003 - 3009
2016 International SoC Design Conference (ISOCC) > 307 - 308
IEEE Transactions on Magnetics > 2016 > 52 > 10 > 1 - 10