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IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 638 - 641
IEEE Electron Device Letters > 2014 > 35 > 12 > 1284 - 1286
2011 International Reliability Physics Symposium > CD.1.1 - CD.1.6
29th Annual Proceedings Reliability Physics 1991 > 234 - 238