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IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 607 - 614
IEEE Transactions on Electron Devices > 2012 > 59 > 1 > 108 - 113
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 4 > 607 - 614
IEEE Transactions on Electron Devices > 2012 > 59 > 1 > 108 - 113