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2016 IEEE International Electron Devices Meeting (IEDM) > 31.5.1 - 31.5.4
IEEE Journal of the Electron Devices Society > 2016 > 4 > 5 > 335 - 346
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.5.1 - 3C.5.7
2013 IEEE International Reliability Physics Symposium (IRPS) > 4C.4.1 - 4C.4.4
Journal of Microelectromechanical Systems > 2013 > 22 > 2 > 253 - 255
Journal of Microelectromechanical Systems > 2012 > 21 > 5 > 1229 - 1240
2010 IEEE MTT-S International Microwave Symposium > 1246 - 1249