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IEEE Electron Device Letters > 2017 > 38 > 6 > 712 - 715
2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-2.1 - 3F-2.6
IEEE Electron Device Letters > 2017 > 38 > 6 > 712 - 715
2017 IEEE International Reliability Physics Symposium (IRPS) > 3F-2.1 - 3F-2.6