Wyniki wyszukiwania
IEEE Transactions on Electron Devices > 2017 > 64 > 11 > 4374 - 4385
IEEE Sensors Journal > 2016 > 16 > 14 > 5524 - 5535
2016 IEEE International Reliability Physics Symposium (IRPS) > MY-1-1 - MY-1-6
IEEE Transactions on Electron Devices > 2015 > 62 > 7 > 2197 - 2204
IEEE Transactions on Electron Devices > 2015 > 62 > 5 > 1668 - 1671
2015 IEEE International Reliability Physics Symposium > 5B.6.1 - 5B.6.6
IEEE Transactions on Electron Devices > 2015 > 62 > 3 > 847 - 854
IEEE Transactions on Electron Devices > 2014 > 61 > 12 > 4098 - 4104
IEEE Transactions on Nanotechnology > 2013 > 12 > 3 > 413 - 426
IEEE Electron Device Letters > 2012 > 33 > 8 > 1192 - 1194
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 3084 - 3090
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3561 - 3567
IEEE Electron Device Letters > 2012 > 33 > 9 > 1267 - 1269
IEEE Transactions on Electron Devices > 2011 > 58 > 3 > 584 - 592
IEEE Transactions on Electron Devices > 2011 > 58 > 10 > 3635 - 3638
IEEE Transactions on Electron Devices > 2010 > 57 > 10 > 2690 - 2696
IEEE Electron Device Letters > 2010 > 31 > 9 > 1023 - 1025
IEEE Transactions on Electron Devices > 2010 > 57 > 5 > 1047 - 1054
IEEE Electron Device Letters > 2010 > 31 > 9 > 999 - 1001
IEEE Transactions on Electron Devices > 2010 > 57 > 8 > 1838 - 1845